PICCO, ANDREA
PICCO, ANDREA
DIPARTIMENTO DI SCIENZA DEI MATERIALI (attivo dal 01/01/1998 al 30/09/2012)
Dislocation distribution across ultrathin silicon-on-insulator with epitaxial SiGe stressor
2013 Bonera, E; Gatti, R; Isella, G; Norga, G; Picco, A; Grilli, E; Guzzi, M; Texier, M; Pichaud, B; von Känel, H; Miglio, L
Substrate strain manipulation by nanostructure perimeter forces
2013 Bonera, E; Bollani, M; Chrastina, D; Pezzoli, F; Picco, A; Schmidt, O; Terziotti, D
Composition profiling of inhomogeneous SiGe nanostructures by Raman spectroscopy
2012 Picco, A; Bonera, E; Pezzoli, F; Grilli, E; Schmidt, O; Isa, F; Cecchi, S; Guzzi, M
Resonance effects in the Raman analysis of sige nanostructures
2012 Picco, A
Determination of Raman Efficiency in SiGe Alloys
2010 Picco, A; Bonera, E; Grilli, E; Giarola, M; Mariotto, G; Chrastina, D; Guzzi, M
Ge-rich islands grown on patterned Si substrates by low-energy plasma-enhanced chemical vapour deposition
2010 Bollani, M; Chrastina, D; Fedorov, A; Sordan, R; Picco, A; Bonera, E
Ordered Arrays of SiGe Islands from Low-Energy PECVD
2010 Bollani, M; Bonera, E; Chrastina, D; Fedorov, A; Montuori, V; Picco, A; Tagliaferri, A; Vanacore, G; Sordan, R
Raman efficiency in SiGe alloys
2010 Picco, A; Bonera, E; Grilli, E; Guzzi, M