This paper presents GEMINI, an entire read-out System-on-Chip (SoC) to be used with the Triple Gas-Electron Multiplier (GEM) detector. Designed in CMOS 180 nm technology, GEMINI pushes towards the state-of-the-art for this peculiar detector front-end, as regards the count rate and detector pixel parasitic capacitance sustainability. It is composed of 16 channels, each performing a charge-to-voltage conversion via a Charge-Sensitive Preamplifier (CSP), a successive event discrimination with channel-independent threshold and an event-triggered reset. The CSP analog output and the LVDS discriminator output are available as chip outputs for each channel. The Q-to-V conversion accuracy is guaranteed by an automatic on-chip calibration unit, compensating for environmental, CMOS process and supply voltage variations. GEMINI is able to sustain a 5 Mcps count rate, managing up to 40 pF pixel capacitance and with a 2.7mW/ch power consumption.

Pezzotta, A., Corradi, G., Croci, G., DE MATTEIS, M., Murtas, F., Gorini, G., et al. (2015). GEMINI: A triple-GEM detector read-out mixed-signal ASIC in 180nm CMOS. In Circuits and Systems (ISCAS), 2015 IEEE International Symposium on (pp.1718-1721). Institute of Electrical and Electronics Engineers Inc. [10.1109/ISCAS.2015.7168984].

GEMINI: A triple-GEM detector read-out mixed-signal ASIC in 180nm CMOS

PEZZOTTA, ALESSANDRO
Primo
;
CROCI, GABRIELE;DE MATTEIS, MARCELLO;GORINI, GIUSEPPE
Penultimo
;
BASCHIROTTO, ANDREA
Ultimo
2015

Abstract

This paper presents GEMINI, an entire read-out System-on-Chip (SoC) to be used with the Triple Gas-Electron Multiplier (GEM) detector. Designed in CMOS 180 nm technology, GEMINI pushes towards the state-of-the-art for this peculiar detector front-end, as regards the count rate and detector pixel parasitic capacitance sustainability. It is composed of 16 channels, each performing a charge-to-voltage conversion via a Charge-Sensitive Preamplifier (CSP), a successive event discrimination with channel-independent threshold and an event-triggered reset. The CSP analog output and the LVDS discriminator output are available as chip outputs for each channel. The Q-to-V conversion accuracy is guaranteed by an automatic on-chip calibration unit, compensating for environmental, CMOS process and supply voltage variations. GEMINI is able to sustain a 5 Mcps count rate, managing up to 40 pF pixel capacitance and with a 2.7mW/ch power consumption.
paper
CMOS integrated circuits;electron multiplier detectors;mixed analogue-digital integrated circuits;preamplifiers;readout electronics;system-on-chip;CMOS 180 nm technology;CMOS process;CSP;GEMINI;LVDS discriminator output;Q-to-V conversion accuracy;SoC;channel-independent threshold;charge-sensitive preamplifier;charge-to-voltage conversion;count rate;detector front-end;detector pixel parasitic capacitance sustainability;event-triggered reset;on-chip calibration unit;read-out system-on-chip;size 180 nm;successive event discrimination;supply voltage variations;triple GEM detector;triple gas-electron multiplier detector;triple-GEM detector read-out mixed-signal ASIC;CMOS integrated circuits;Calibration;Capacitance;Detectors;Noise;Sensitivity;System-on-chip;ASIC;CMOS;GEM;detector;front-end;low-power;preamplifier;read-out;system-on-chip
English
ISCAS 2015
2015
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
9781479983919
2015
2015-
1718
1721
7168984
none
Pezzotta, A., Corradi, G., Croci, G., DE MATTEIS, M., Murtas, F., Gorini, G., et al. (2015). GEMINI: A triple-GEM detector read-out mixed-signal ASIC in 180nm CMOS. In Circuits and Systems (ISCAS), 2015 IEEE International Symposium on (pp.1718-1721). Institute of Electrical and Electronics Engineers Inc. [10.1109/ISCAS.2015.7168984].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/88595
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