The plasma interaction with the surface produces modifications of its chemical structure or morphology. Surface modifications through cold plasma occur, thanks to the high plasma reactivity and ability to affect the surface of materials. The present work shows the surface modification of polyethylene terephthalate (PET) films after the exposure both to, low-pressure plasma (film deposition by plasma enhanced chemical vapour deposition) and to an atmospheric pressure dielectric barrier discharge (surface etching). After plasma treatment we have analysed the effect on the PET surface. For the atmospheric pressure plasma-treated samples, contact angle and atomic force microscope analysis enable us to determine roughness changes. For the low-pressure plasma samples, contact angles and Fourier transform infrared absorption spectroscopy analysis are used to estimate the chemical composition of the deposition and focused ion beam analysis to collect the image and calculate the thickness of plasma deposition. Both plasma treatments (film deposition and etching) cause changes in optical properties as indicated by reflectivity measurements. (C) 2007 Elsevier Ltd. All rights reserved.
Esena, P., Zanini, S., Riccardi, C. (2007). Plasma processing for surface optical modifications of PET films. VACUUM, 82(2), 232-235 [10.1016/j.vacuum.2007.07.054].
Plasma processing for surface optical modifications of PET films
ESENA, PAOLA
;ZANINI, STEFANO;RICCARDI, CLAUDIA
2007
Abstract
The plasma interaction with the surface produces modifications of its chemical structure or morphology. Surface modifications through cold plasma occur, thanks to the high plasma reactivity and ability to affect the surface of materials. The present work shows the surface modification of polyethylene terephthalate (PET) films after the exposure both to, low-pressure plasma (film deposition by plasma enhanced chemical vapour deposition) and to an atmospheric pressure dielectric barrier discharge (surface etching). After plasma treatment we have analysed the effect on the PET surface. For the atmospheric pressure plasma-treated samples, contact angle and atomic force microscope analysis enable us to determine roughness changes. For the low-pressure plasma samples, contact angles and Fourier transform infrared absorption spectroscopy analysis are used to estimate the chemical composition of the deposition and focused ion beam analysis to collect the image and calculate the thickness of plasma deposition. Both plasma treatments (film deposition and etching) cause changes in optical properties as indicated by reflectivity measurements. (C) 2007 Elsevier Ltd. All rights reserved.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.