in semiconductors play a key role in established technologies. Presently, they are increasingly seen as a novel degree of freedom to tailor the optoelectronic properties of materials and to enable novel device functionalities. Here we utilize optical spectroscopy to characterize the spectral feature attributed to extended defects in p-i-n diodes based on Ge/SiGe MQWs. Specifically, we determined the effective lifetime to be in the hundreads of ns regime and we employ an external bias to demonstrate control over the recombination dynamics.

Pedrini, J., Cis, M., Talamas Simola, E., Bonera, E., Isella, G., Pezzoli, F. (2024). Ge-based photonics for quantum technologies. In 2024 IEEE Photonics Society Summer Topicals Meeting Series (SUM) (pp.1-2). Institute of Electrical and Electronics Engineers Inc. [10.1109/SUM60964.2024.10614493].

Ge-based photonics for quantum technologies

Pedrini J.;Bonera E.;Pezzoli F.
2024

Abstract

in semiconductors play a key role in established technologies. Presently, they are increasingly seen as a novel degree of freedom to tailor the optoelectronic properties of materials and to enable novel device functionalities. Here we utilize optical spectroscopy to characterize the spectral feature attributed to extended defects in p-i-n diodes based on Ge/SiGe MQWs. Specifically, we determined the effective lifetime to be in the hundreads of ns regime and we employ an external bias to demonstrate control over the recombination dynamics.
paper
Defects in semiconductros; dislocations; Dynamics; Germa-nium quantum wells; Photoluminescence;
English
2024 IEEE Photonics Society Summer Topicals Meeting Series, SUM 2024 - 15 July 2024 through 17 July 2024
2024
2024 IEEE Photonics Society Summer Topicals Meeting Series (SUM)
9798350393873
2024
1
2
none
Pedrini, J., Cis, M., Talamas Simola, E., Bonera, E., Isella, G., Pezzoli, F. (2024). Ge-based photonics for quantum technologies. In 2024 IEEE Photonics Society Summer Topicals Meeting Series (SUM) (pp.1-2). Institute of Electrical and Electronics Engineers Inc. [10.1109/SUM60964.2024.10614493].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/530704
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