Performance of a triple GEM detector equipped with Al-GEM foils for X-rays detection

The study of Soft X-ray emission can be a source of fundamental information, particularly for what concerns tokamaks and plasma diagnostics, but also in general in the fields of high energy and nuclear physics. Detection systems based on Gas Electron Multipliers (GEM) technology can be of particular use in the context of X-ray analyses, being relatively low cost while maintaining good spatial and temporal resolution and capability to sustain high counting rates (up to MHz/mm2). The development of these new and improved detectors is thus of interest, especially in the research about diagnostic and control of machines for fusion energy. In this work, the performance of a new triple-GEM detector, characterized by an aluminum metallic coating on both layers of the GEM foils, is presented and a comparison is made with the more conventional design employing copper coating. The performances of an aluminum-coated GEM (Al-GEM) detector and of a standard copper-coated GEM (Cu-GEM) detector in revealing quasi-monochromatic X-ray beams coming from different fluorescence materials are compared. The Al-GEM detector is shown to less suffer the issue of unwanted background on the signal caused by the presence of copper inside the detector itself. The suppression of this noise source encourages the use of Al-GEM detectors to perform spectroscopy in harsh environments, such as tokamak machines, where soft X-rays are useful probes to control different plasma properties and parameters.