The use of the Soft X-ray Contact Microscopy technique is discussed as a possible new tool to get information on dopant distribution in the core of single-mode optical fibers with 50 nm spatial resolution.
Milani, M., Batani, D., Ballerini, M., Pozzi, A., Savoia, C. (2004). Microscopy characterization of doped fibers. LASER AND PARTICLE BEAMS, 22(3), 351-354 [10.1017/S0263034604223205].
Microscopy characterization of doped fibers
MILANI, MARZIALE
;BATANI, DINO DIMITRI;
2004
Abstract
The use of the Soft X-ray Contact Microscopy technique is discussed as a possible new tool to get information on dopant distribution in the core of single-mode optical fibers with 50 nm spatial resolution.File in questo prodotto:
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