Spectroscopic ellipsometry in the range from 300 to 800 nm is applied for the determination of the optical properties of potassium acid phtalate crystals, of particular interest for their use as substrates for the epitaxial deposition of highly oriented polymers. The study is based on the analysis of measurements performed on differently oriented samples at different angles of incidence. Such measurements are used to reduce uncertainty in the analysis. © 1998 Elsevier Science S.A.
Sassella, A., Tubino, R., Borghesi, A., Giardini, M., Quadrelli, L. (1998). Spectroscopic ellipsometry measurements on an anisotropic organic crystal: Potassium acid phtalate. THIN SOLID FILMS, 313-314, 347-350 [10.1016/S0040-6090(97)00844-4].
Spectroscopic ellipsometry measurements on an anisotropic organic crystal: Potassium acid phtalate
SASSELLA, ADELE;TUBINO, RICCARDO;BORGHESI, ALESSANDRO;
1998
Abstract
Spectroscopic ellipsometry in the range from 300 to 800 nm is applied for the determination of the optical properties of potassium acid phtalate crystals, of particular interest for their use as substrates for the epitaxial deposition of highly oriented polymers. The study is based on the analysis of measurements performed on differently oriented samples at different angles of incidence. Such measurements are used to reduce uncertainty in the analysis. © 1998 Elsevier Science S.A.
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