In this paper, we present a novel technique for the nanoscale characterization of the outer and inner structure of tyre debris. Tyre debris is produced by the normal wear of tyres. In previous studies, the microcharacterization and identification were performed by analytical electron microscopy. This study is a development of the characterization of surface and microstructure of tyre debris. For the first time, tyre debris was analysed by focused ion beam (FIB), a technique with 2- to 5-nm resolution that does not require any sample preparation. We studied tyre debris produced in the laboratory. We made electron and ionic imaging of the surface of the material, and after a ionic cut, we studied the internal microstructure of the same sample. The tyre debris was analysed by FIB without any sample preparations unlike the case of scanning and transmission electron microscopy (SEM and TEM). Useful information was derived to improve detection and monitoring techniques of pollution by tyre degradation processes

Milani, M., Pucilloa, F., Ballerinia, M., Camatini, M., Gualtieri, M., Martino, S. (2004). First evidence of tyre debris characterization at the nanoscale by focused ion beam. MATERIALS CHARACTERIZATION, 52(4-5), 283-288 [10.1016/j.matchar.2004.06.001].

First evidence of tyre debris characterization at the nanoscale by focused ion beam

MILANI, MARZIALE;CAMATINI, MARINA CARLA;GUALTIERI, MAURIZIO;
2004

Abstract

In this paper, we present a novel technique for the nanoscale characterization of the outer and inner structure of tyre debris. Tyre debris is produced by the normal wear of tyres. In previous studies, the microcharacterization and identification were performed by analytical electron microscopy. This study is a development of the characterization of surface and microstructure of tyre debris. For the first time, tyre debris was analysed by focused ion beam (FIB), a technique with 2- to 5-nm resolution that does not require any sample preparation. We studied tyre debris produced in the laboratory. We made electron and ionic imaging of the surface of the material, and after a ionic cut, we studied the internal microstructure of the same sample. The tyre debris was analysed by FIB without any sample preparations unlike the case of scanning and transmission electron microscopy (SEM and TEM). Useful information was derived to improve detection and monitoring techniques of pollution by tyre degradation processes
Articolo in rivista - Articolo scientifico
Focused ion beam; Tyre debris; Ultramicroscopy; Rubber; Sample preparation
English
2004
52
4-5
283
288
none
Milani, M., Pucilloa, F., Ballerinia, M., Camatini, M., Gualtieri, M., Martino, S. (2004). First evidence of tyre debris characterization at the nanoscale by focused ion beam. MATERIALS CHARACTERIZATION, 52(4-5), 283-288 [10.1016/j.matchar.2004.06.001].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/22389
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