A system for measuring ambient light as well as proximity of a reflective object is presented. A new technique of ambient light disturbance cancellation in proximity mode is proposed, enabling high accuracy measurements over a wide range of backlight. The chip, built in a 0.25μm CMOS technology, is capable of measuring ambient light intensities with a resolution better than 0.25lx at a 16klx full-scale and a reflected proximity IR signal with amplitude down to 200pA, rejecting backlight variations from 0 to 100μA
Sant, L., Fant, A., Torta, P., Dörrer, L. (2012). A system containing an ambient light and a proximity sensor with intrinsic ambient light rejection. In European Solid-State Circuits Conference (pp.97-100). SMSC,Region Aquitaine,CSEM,Atlantic Innovation,ST [10.1109/ESSCIRC.2012.6341265].
A system containing an ambient light and a proximity sensor with intrinsic ambient light rejection
SANT, LUCA;
2012
Abstract
A system for measuring ambient light as well as proximity of a reflective object is presented. A new technique of ambient light disturbance cancellation in proximity mode is proposed, enabling high accuracy measurements over a wide range of backlight. The chip, built in a 0.25μm CMOS technology, is capable of measuring ambient light intensities with a resolution better than 0.25lx at a 16klx full-scale and a reflected proximity IR signal with amplitude down to 200pA, rejecting backlight variations from 0 to 100μA
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