In the present work we report an experimental investigation by electron paramagnetic resonance spectroscopy on the hyperfine structure of the E. point defect, probing the local arrangement of the network (range-II order), and by Raman spectroscopy on the D 1 and D 2 lines, probing mean features of the network (range-III order). Our studies, performed on a-SiO 2 samples thermally treated at 1000 °C in air for different time durations, show that changes of the hyperfine structure and of the D 1 and D 2 lines occur in a correlated way. These results give strong evidence that the range-II and range-III order properties are intimately related to each other and that these properties are determined by the history of the material. © 2010 EDP Sciences, Società Italiana di Fisica, Springer-Verlag

Vaccaro, G., Buscarino, G., Agnello, S., Messina, G., Carpanese, M., Gelardi, F. (2010). Structural properties of the range-II-and range-III order in amorphous-SiO 2 probed by electron paramagnetic resonance and Raman spectroscopy. THE EUROPEAN PHYSICAL JOURNAL. B, CONDENSED MATTER PHYSICS, 76(2), 197-201 [10.1140/epjb/e2010-00189-y].

Structural properties of the range-II-and range-III order in amorphous-SiO 2 probed by electron paramagnetic resonance and Raman spectroscopy

VACCARO, GIANFRANCO
;
2010

Abstract

In the present work we report an experimental investigation by electron paramagnetic resonance spectroscopy on the hyperfine structure of the E. point defect, probing the local arrangement of the network (range-II order), and by Raman spectroscopy on the D 1 and D 2 lines, probing mean features of the network (range-III order). Our studies, performed on a-SiO 2 samples thermally treated at 1000 °C in air for different time durations, show that changes of the hyperfine structure and of the D 1 and D 2 lines occur in a correlated way. These results give strong evidence that the range-II and range-III order properties are intimately related to each other and that these properties are determined by the history of the material. © 2010 EDP Sciences, Società Italiana di Fisica, Springer-Verlag
Articolo in rivista - Articolo scientifico
Electron paramagnetic resonance; Electron paramagnetic resonance spectroscopy; Experimental investigations; Hyperfine structure; Time duration; Electron resonance; Electron spin resonance spectroscopy; Paramagnetic materials; Point defects; Raman scattering; Raman spectroscopy; Silicon compounds; Paramagnetic resonance
English
2010
76
2
197
201
none
Vaccaro, G., Buscarino, G., Agnello, S., Messina, G., Carpanese, M., Gelardi, F. (2010). Structural properties of the range-II-and range-III order in amorphous-SiO 2 probed by electron paramagnetic resonance and Raman spectroscopy. THE EUROPEAN PHYSICAL JOURNAL. B, CONDENSED MATTER PHYSICS, 76(2), 197-201 [10.1140/epjb/e2010-00189-y].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/123089
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